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Effect of grain size and doping level of SiC on the superconductivity and critical current density in MgB/sub 2/ superconductor

机译:SiC的粒径和掺杂水平对MgB / sub 2 /超导体中超导性和临界电流密度的影响

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摘要

SiC doped MgB/sub 2/ polycrystalline samples were fabricated by in-situ reaction using different grain sizes (20 nm, 100 nm, and 37 /spl mu/m) of SiC and different doping levels (0, 8, 10, 12, 15 wt%). Phases, microstructures, superconductivity, critical current density and flux pinning have been systematically investigated using XRD, SEM, TEM, and magnetic measurements. Results show that grain sizes of the starting precursors of SiC have a strong effect on the critical current density and its field dependence. The smaller the SiC grains are, the better the J/sub c/ field performance is. Significant enhancement of J/sub c/ and the irreversibility field H/sub irr/ were revealed for all the SiC doped MgB/sub 2/ with additions up to 15 wt%. A J/sub c/ as high as 20,000 A/cm/sup 2/ in 8 Tesla at 5 K was achieved for the sample doped with 10 wt% SiC with a grain size of 20 nm. Results indicate that the nano-inclusions and substitution inside MgB/sub 2/ are responsible for the enhancement of flux pinning.
机译:SiC掺杂的MgB / sub 2 /多晶样品是通过原位反应使用不同粒度(20 nm,100 nm和37 / spl mu / m)的SiC和不同掺杂水平(0、8、10、12、12)制备的15重量%)。已使用XRD,SEM,TEM和磁测量系统地研究了相,微结构,超导性,临界电流密度和磁通钉扎。结果表明,SiC起始母体的晶粒尺寸对临界电流密度及其场依赖性有很大影响。 SiC晶粒越小,J / sub c /场性能越好。对于所有掺入SiC的MgB / sub 2 /,添加至多15 wt%的J / sub c /和不可逆场H / sub irr /,都显示出显着增强。对于掺杂有10 wt%SiC且晶粒尺寸为20 nm的样品,在5 K下在8 Tesla中达到了20,000 A / cm / sup 2 /的J / sub c /。结果表明,MgB / sub 2 /内部的纳米夹杂物和取代物可促进磁通钉扎。

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